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EMI Noise Source Impedance Extraction Method based on Double Current Probe and Four Kinds of State Test |
Zhao Bo1, Yan Jingrui2, Zhao Yang2 |
1. Jiangsu Institute of Metrology, Nanjing 210023; 2. Nanjing Normal University, Nanjing 210042 |
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Abstract Based on the double current probe, the transmission parameters and reflection parameters of the short circuit, loading standard resistance, capacitance, inductance and loading noise source impedance are measured by using the principle of scattering parameters. A test on commercial switching power supplied as the test object was carried out, in which the source impedance amplitude and phase are measured and calculated and the validity of the method is verified. This paper designs four kinds of testing methods, which basically cover all the impedance description, and overcome the approximation and the ideal of the constraints existing in the testing process, improve the accuracy of measurement, and provide a reference for the design of electromagnetic interference filter.
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Received: 22 September 2016
Published: 22 September 2016
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Cite this article: |
Zhao Bo,Yan Jingrui,Zhao Yang. EMI Noise Source Impedance Extraction Method based on Double Current Probe and Four Kinds of State Test[J]. Electrical Engineering, 2016, 17(9): 21-25.
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URL: |
http://dqjs.cesmedia.cn/EN/Y2016/V17/I9/21
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