Electrical Engineering  2017, Vol. 18 Issue (10): 123-126    DOI:
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Research and Development of Integrated Intelligent Verification System for Microcomputer Automatic Tester
Wan Xinshu1, Wu Qiang1, Lin Daohong1, Zhu Wangcheng1, Li Dongsheng2
1. Electric Power Research Institute of Hainan Power Grid Co., Ltd, Haikou 570311;
2. PONOVO Power Co., Ltd, Beijing 100098

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Abstract  The verification of microcomputer-based relay protection tester has the characteristics of complex detection process, high precision of detection and low efficiency of conventional detection method. In this paper, the comprehensive intelligent test of microcomputer-based relay protection tester is researched and developed. First of all, the composition and principle of the verification system were designed and developed, and through the communication between the relay protection tester and high-precision AC-DC table to complete the entire closed-loop system. The hardware platform is designed to complete the hardware structure of the intelligent verification system itself. The hardware requirements of the intelligent test module are completed by high precision AC-DC table, switching device, automatic adjustment load and other hardware modules. The software platform completes the editing of the test scheme and the test report for different test items through the secondary development platform. Through the tester driving module, the software output of the analog voltage and current is completed, and through the high-precision table communication, the measurement reading, measurement error calculation and test report generation were completed intellectively. A comprehensive protection test of the relay protection tester was realized.
Key wordsmicrocomputer automatic tester      automatic tester      intelligent detection     
Published: 24 October 2017
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Wan Xinshu
Wu Qiang
Lin Daohong
Zhu Wangcheng
Li Dongsheng
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Wan Xinshu,Wu Qiang,Lin Daohong等. Research and Development of Integrated Intelligent Verification System for Microcomputer Automatic Tester[J]. Electrical Engineering, 2017, 18(10): 123-126.
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https://dqjs.cesmedia.cn/EN/Y2017/V18/I10/123
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