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| Design of Test Case based on Fault Discrimination Logic Diagram |
| Xiong Jing1, Shen Liangping1, Cao Weiguo2, Ma Minjie2 |
1. Faculty of Physics and Electronic Technology, Hubei University, Wuhan 430062;
2. Five-C Smart Power Grid Technology Co., Ltd, Nanjing 211100 |
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Abstract In this paper, there is a study of minimum number of test cases in intelligent stations of different voltage levels through the analysis of fault discrimination logic diagram, and a proposal of a method of automatic generation of test cases is put forward; by combination with the specific engineering examples, the test of the feasibility of the test case is carried out. The generation of test cases improves the efficiency of the test system and facilitates the operation to the staff.
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Published: 06 December 2017
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2017, Vol. 18 
