Abstract：During the service life of gas insulated switchgear (GIS) equipment, epoxy materials are subjected to combined electrical and thermal stresses, which can degrade their voltage resistance and, in severe cases, lead to power system failures. The aging process of dielectric materials is accompanied by changes in the microstructure and a number of energetic properties, which indicate the formation of defects and the deviation of the material from its optimal state. Tracking the trends of microstructure and energy properties during the aging process can help to understand the intrinsic causes of dielectric material aging and the mechanism of insulation degradation. To this end, based on the density functional theory, this paper centers on the simulation of the effect of electrothermal factor on the molecular chain of epoxy resin, and based on the free volume breakdown theory and space charge theory, the connection between the movement of molecular chain as well as the energy characteristics and the breakdown performance of the material is anlyzed, so as to provide a theoretical basis for the aging analysis of epoxy resin insulation materials.
施敏锐, 陈剑山, 戴昱东, 黄汉龙, 刘煌铭. 电热因子联合作用下环氧树脂的电荷陷阱及微观特性[J]. 电气技术, 2025, 26(10): 1-7.
SHI Minrui, CHEN Jianshan, DAI Yudong, HUANG Hanlong, LIU Huangming. Charge trap and microscopic characteristics of epoxy resin under the combined effect of electrothermal factors. Electrical Engineering, 2025, 26(10): 1-7.
2025, Vol. 26 
