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The Aging Test Circuit Used for Vacuum Interrupter |
Zhang Song, Zhang Zhonghua, Wang Yang |
Liaoning High Voltage Apparatus Test Center of Product Quality, Shenyang 110122 |
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Abstract A test circuit parameters for vacuum interrupter aging test is analysed and calculated , and gives the simulation waveforms of the circuit components, the control is easy, can be used in practice, reaches the vacuum interrupter aging purposes.
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Published: 26 February 2016
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