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Analysis and Countermeasure for Data Abnormal Fault of Protective Relay |
Deng Yong1, Huang Feng2, Lu Zhen1, Song Fuhai1, Ren Xiaohui1 |
1. State Grid Fujian Power-Dispatch & Control Center, Fuzhou 350003; 2. State Grid Fuzhou Electric Power Supply Company, Fuzhou 350009 |
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Abstract This paper faced to a fault of protective relay that device alarmed "flash error" with sent the message of differential protection element action. The details of the process of action, inspection and defect diagnosis were introduced. The cause of fault was that the poor contact of Hdlc chip leaded to disorder of CPU bus and maked every chip contacting to the bus operate unstably. According to the fault, the detail of structure of protective relay was analyzed, propound that the status and communication of chips should be monitored and the operation life of Flash should be evaluated.
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Published: 06 December 2017
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Cite this article: |
Deng Yong,Huang Feng,Lu Zhen等. Analysis and Countermeasure for Data Abnormal Fault of Protective Relay[J]. Electrical Engineering, 2017, 18(11): 138-141.
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URL: |
http://dqjs.cesmedia.cn/EN/Y2017/V18/I11/138
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[1] 曾锦松, 郑南章. 变电站继电保护消缺方法的探讨[J]. 电力系统保护与控制, 2008, 36(24): 104-106, 109. [2] 冯军. 智能变电站原理及测试技术[M]. 北京: 中国电力出版社, 2011. [3] 李博通, 李永丽, 姚创, 等. 继电保护系统隐性故障研究综述[J]. 电力系统及其自动化学报, 2014, 26(7): 34-39. [4] 廖瑞金, 刘捷丰, 杨丽君, 等. 电力变压器油纸绝缘状态评估的频域介电特征参量研究[J]. 电工技术学报, 2015, 30(6): 247-254. [5] 李赢, 舒乃秋. 基于模糊聚类和完全二叉树支持向量机的变压器故障诊断[J]. 电工技术学报, 2016, 31(4): 64-70. [6] 陈强, 邓洁清, 潘建亚, 等. 一起主变压器低压侧故障的分析与对策[J]. 电力系统自动化, 2015(8): 164- 167. [7] 刘航, 杨广明, 周海廷, 等. 一起220kV线路单相故障重合闸未动作的事故分析与处理[J]. 电气技术, 2015, 16(9): 118-119, 132. [8] 徐英, 李朝勋. 通道自环引发保护不正确动作的故障分析及对策[J]. 电气技术, 2015, 16(9): 95-97. [9] 王跃强, 廖华兴, 袁晓青, 等. 基于保信系统的继电保护状态评价系统的开发与应用[J]. 电力系统保护与控制, 2014, 42(8): 134-139. [10] 邱金辉, 钱海, 张道农, 等. 基于PFIS的继电保护常态特性在线监视与隐性故障诊断[J]. 电力系统保护与控制, 2015, 43(8): 145-149. [11] HUANG S, CHEN S, QIU Y, 等. Online condition monitoring methodology for relay protection based on self-test information[C]//Advanced Power System Automation and Protection (APAP), 2011 International Conference on, 2011: 256-260. [12] 范娅玲. 闪存芯片(NOR)编程特性与可靠性的研究[J]. 苏州大学学报: 工科版, 2008(3): 64-68. [13] 林刚. NAND Flash坏块管理算法及逻辑层驱动设计[D]. 西安: 西安电子科技大学, 2009. [14] 陈志雄. 微机保护硬件平台可靠性设计研究[D]. 成都: 西南交通大学, 2006. |
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