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| Research and device development of residence time testing technology for network acquisition switch based on large scale FPGA |
| Zhang Yongqiang, Guo Cheng, Zhang Haojun, Zhang Zijian, Geng Chaopeng |
| Xi’an XD Switchgear Electric Co., Ltd, Xi’an 518132 |
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Abstract GIS is one of the important components in the power system. It is an important device to protect the safety of the power system and control the circuit of the power system. Before the GIS equipment leaves the factory, it is necessary to carry out a number of tests on the GIS equipment. The current factory inspection test data is saved on the computer in paper report or in scattered test data. So data retrieval and reuse is difficult. The system realizes the network and digital management of GIS factory test by using computer technology, database technology and network technology.
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Received: 19 September 2018
Published: 21 May 2019
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| Cite this article: |
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Zhang Yongqiang,Guo Cheng,Zhang Haojun等. Research and device development of residence time testing technology for network acquisition switch based on large scale FPGA[J]. Electrical Engineering, 2019, 20(5): 64-68.
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| URL: |
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http://dqjs.cesmedia.cn/EN/Y2019/V20/I5/64
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2019, Vol. 20 
