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The Analysis and Processing on the Aberrant PD of 35kV Switchgear |
Zhang Xiongqing, Liu Li, Jin Hailong |
Zhoushan Power company, Zhoushan, Zhejiang 316000 |
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Abstract The PD of the 10kV~35kV Metal-enclosed switchgear is the main reason for the accident that the insulation is damaged. The paper mainly introduces the principle of the detection on the PD of the switchgear. The TEV methods and the ultrasound detection are adopted for the detection of the PD. The results show that the detection of the PD is effective to detect the defect of the PD of the switchgear.
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Cite this article: |
Zhang Xiongqing,Liu Li,Jin Hailong. The Analysis and Processing on the Aberrant PD of 35kV Switchgear[J]. Electrical Engineering, 2013, 14(6): 58-60.
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URL: |
http://dqjs.cesmedia.cn/EN/Y2013/V14/I6/58
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