电气技术  2020, Vol. 21 Issue (10): 127-132    DOI:
技术与应用 |
断路器故障引起高抗匝间保护跳闸原因分析
刘欢庆1, 南东亮1, 王龙龙2, 汤小兵3, 张路1
1.国网新疆电力有限公司电力科学研究院,乌鲁木齐 830011;
2.新疆送变电有限公司,乌鲁木齐 830000;
3.南京国电南思科技发展股份有限公司,南京 211153
Analysis of trip causes of interturn protection of HV reactor caused by circuit breaker failure
Liu Huanqing1, Nan Dongliang1, Wang Longlong2, Tang Xiaobing3, Zhang Lu1
1. Electric Power Research Institute State Grid Xinjiang Electric Power Co., Ltd, Urumqi 830011;
2. Xinjiang Power Transmission and Transformation Co., Ltd, Urumqi 830000;
3. Nanjing SP-NICE Technology Development Co., Ltd, Nanjing 211153
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摘要 针对一起变电站高抗断路器跳闸案例,本文从一次设备、二次设备和保护原理3个方面查找原因,发现由于检修期间对高抗断路器频繁开合再加之设备投运年限长,引起断路器弹簧疲软,导致高抗零序阻抗匝间保护跳闸。通过调节断路器的弹簧压缩量,以满足断路器开关特性要求,为现场人员对老旧设备的运维管理、同类故障的分析及处理提供参考,避免此类事件发生,从而保证正常送电。
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刘欢庆
南东亮
王龙龙
汤小兵
张路
关键词 高压电抗器断路器零序阻抗匝间保护弹簧压缩量开关特性    
Abstract:This paper combines a case of a circuit breaker trip of a high-voltage reactor in a substation and looks for it from three aspects of primary equipment, secondary equipment, and protection principles. Due to the long service life of the equipment and the frequent opening and closing of the high-voltage reactor circuit breaker during maintenance, Causes circuit breaker spring weakness and high-voltage reactor interturn protection trip. By adjusting the spring compression of the circuit breaker to meet the requirements of the circuit breaker's switching characteristics, it provides a reference for the field personnel to operate and maintain the old equipment, analyze and deal with similar failures, avoid such events, and ensure normal power transmission.
Key wordshigh-voltage reactor    circuit breaker    zero sequence protection    spring compression    switching characteristics   
收稿日期: 2020-03-06     
作者简介: 刘欢庆(1992-),女,陕西省咸阳市人,硕士,主要从事电力系统继电保护工作。
引用本文:   
刘欢庆, 南东亮, 王龙龙, 汤小兵, 张路. 断路器故障引起高抗匝间保护跳闸原因分析[J]. 电气技术, 2020, 21(10): 127-132. Liu Huanqing, Nan Dongliang, Wang Longlong, Tang Xiaobing, Zhang Lu. Analysis of trip causes of interturn protection of HV reactor caused by circuit breaker failure. Electrical Engineering, 2020, 21(10): 127-132.
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https://dqjs.cesmedia.cn/CN/Y2020/V21/I10/127